Electronics & Communications

Microelectronics and VLSI Engineering Laboratory
Microelectronics and VLSI Engineering Laboratory

MOS Capacitor || BJT Characterization (Gummel Plot) || Output Characteristics of a NPN Transistor || Emitter resistance || Collector Resistance || HFE Characteristics || IDVD || IdVg || Phototransistor Characterization || Thin Film Roughness Measurement || Thickness Measurement Using Ellipsometer || MOSFET SPICE Parameter Extraction || BJT SPICE Parameter Extraction || Determination of Vth of a MOSFET || JFET Characterization
Basic Electronics
Basic Electronics

Basic Electronics
Digital Electronic Circuits Laboratory
Digital Electronic Circuits Laboratory

Analysis of Functions of BCD-TO-7-segment Decoder / Driver and Operation of 7-segment LED Display || Characterization of Digital Logic Families || Analysis and Synthesis of Boolean Expressions using Basic Logic Gates || Analysis and Synthesis of Logic Functions using Multiplexers || Analysis and Synthesis of Logic Functions using Decoders
Technology CAD (TCAD) Laboratory
Technology CAD (TCAD) Laboratory

Digital Signal Processing Laboratory
Digital Signal Processing Laboratory

Study of sampling theorem, effect of undersampling || Study of Quantization of continuous-amplitude, discrete-time analog signals || Study of different types of Companding Techniques || Study of properties of Linear time-invariant system || Study of convolution: series and parallel system
Fading Channels and Mobile Communications
Fading Channels and Mobile Communications

Semiconductor Devices Laboratory
Developed by: Dr.C.K.Maiti, Email: ckm@ece.iitkgp.ernet.in, Institute: Indian Institute of Technology, Kharagpur

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