Structural Characterization of Materials Lab

Developed by : Dr.S.Das, Contact email: sdas@metal.iitkgp.ernet.in, Institute: Indian Institute of Technology Kharagpur

New link of Structural Characterization of Materials Lab
http://vlabs.iitkgp.ernet.in/scm/
Virtual Lab Class & Remote Access Facility
About Virtual Lab Class & Remote Access Facility
Production and Measurements of X-rays
To study the constructional features of an x-ray machine and production of x-ray.
Phase Identification by XRD
The phase analysis is performed to determine which crystalline phases are present in the sample.
Indexing of Powder Patterns
To determine the lattice parameter of powder specimen.
Estimation of Precise Lattice Parameter of Cubic Crystals
To precisely determine the lattice parameter of powder specimen.
Determination of Retained Austenite in Quenched Steel
To determine the phase composition of the given steel sample using direct comparison method
Measurement of Residual Stress by X-ray diffraction
To estimate the residual stress in a rolled sample in the rolling direction.
Quantitative X-ray analysis using Rietveld Refinement
To understand the basics of Rietveld Refinement and perform the analysis on TOPAS 4
Evaluation Quiz for XRD
Quiz
High Resolution Imaging with SEM
Secondary Electron (SE) and Back Scattered Electron (BSE) imaging of gold ball specimen will be take at different magnifications and accelerating voltages.
Effect of beam energy on SEM imaging
The main motive of this experiment is to explore principal phenomena at low beam energy. Image prepared at conventional beam energy (eg: 30 kV) has been compared with low beam energy (eg: 2 kV)
Charging effect on non conducting sample and its elimination
The main motive of this experiment is to show, how the non conducting samples are charged during SEM analysis and how to minimize the charging.
Powder sample preparation for SEM analysis
To demonstrate different sample preparation techniques for powders in SEM
Back Scattered Electron Imaging
The main motive of this experiment is to demonstrate the influence of the electron detector on the final appearance of the SEM image.
Fracture surface analysis by SEM
Analysis of the fracture surface by using SEM
EDS analysis
To demonstrate basic idea about EDS analysis
Effect of Current Density on the Nucleation and Growth of Crystal Facets during Electrodeposition
Different growth morphology was observed under Scanning Electron Microscope and correlated with the simulated structure prepared through SHAPE-V7.3 software. This different structure can be put into different applications. Further compositional analysis was done to understand intermetallic formation in tin which is going to be used as a lead-free solder material
Compositional and Morphological analysis of Meteorite samples
To find out the phases present and how did they form (at what cooling rate); the nature of solid state diffusion took place and the change in microstructure created by the impact during falling
Case Study with SEM: Morphological analysis of disperse protein sample
Protein sample were dispersed into salt water. The salt is evaporated to drop cast dispersed protein. The morphology of protein was observed.
Case Study with SEM: Morphological analysis of Nickel foams
Nickel foams have high surface area. So it can be used as a potential electron collecting material for battery, capacitor, catalysis purposes etc. Hence the pore size and the structural integrity of the material is important. Here pore size, distribution was measured by SEM.
Case Study with SEM: Formation of alpha titanium phase in beta titanium grains
Alpha and Beta titanium have difference in composition which can be resolved by BSE imaging. Hence alpha precipitation in midst of beta grain was observed
Evaluation Quiz for SEM
Quiz
Atomic Force Microscopy
Operating principle of AFM and its usefulness
Surface topography of a metallic sample in contact mode using Atomic Force Microscopy
This experiment aims at mapping the surface topography of a metallic sample using an Atomic Force Microscope (AFM) to estimate the level of roughness of the material.
Surface topography of a metallic sample in non contact mode using Atomic Force Microscopy
This experiment aims at mapping the surface topography of a metallic sample using an Atomic Force Microscope (AFM) to estimate the level of roughness of the material.
Surface topography of a metallic sample in using Scanning Tunnelling Microscopy.
This experiment aims at mapping the surface topography of a metallic sample using Sanning Tunneling Microscope (AFM) to estimate the level of roughness of the material.
Surface topography of a metallic sample in using Magnetic Force Microscope
This experiment aims at mapping the surface topography of a metallic sample using Magnetic Force Microscope (MFM) to estimate the level of roughness of the material.
Surface topography of a ceramic sample using Atomic Force Microscopy
This experiment aims at mapping the surface topography of a ceramic sample using an Atomic Force Microscope (AFM). AFM was carried out to check the grain boundaries and further to find out its contribution in terms of ionic conductivity.
Compositional Mapping using LFM
To differentiate between coated and uncoated carbon nanotubes using Lateral Force Microscopy.
Surface roughness analysis of metallic sample in contact mode/non-contact mode using Atomic Forc
This experiment aims at analysing the surface roughness of a metallic sample using an Atomic Force Microscope (AFM).
High Resolution AFM Imaging of Carbon Nanotubes coated with Sn-Based Material
To obtain high resolution images of carbon nanotubes coated with Sn-based material using AFM.
Evaluation Quiz for AFM
Quiz
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