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Effect of beam energy on SEM imaging
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The main motive of this experiment is to explore principal phenomena at low beam energy. Image prepared at conventional beam energy (eg: 30 kV) has been compared with low beam energy (eg: 2 kV)


 

Equipoment  

Field emission gun environmental scanning electron microscopy equipped with

ET detector 

 

 Specimen

      Carbon coated copper grid

 Data presentation and analysis 

 

SEM images depicting the morphological features of carbon coated copper grid at 30kV and 2 kV are shown in Fig. 1 and Fig. 2, respectively. From these images, it is well established that the thin layer of carbon coating on copper is only visible at 2 kV. Such, observation is associated to the lower depth of penetration of electron beam up on exposed to 2 kV, compared to that of 30 kV. Therefore, it is obvious that for a given sample, to analyze surface features low beam energy is preferable. However, for better resolution, optimization of beam energy is essential.  

 

Fig. 1: SEM image of carbon coated copper grid at beam energy of 30 kV

        

Fig. 2: SEM image of carbon coated copper grid at beam energy of 2 kV

Fig. 1: SEM image of carbon coated copper grid at beam energy of 30 kV

  Fig. 2: SEM image of carbon coated copper grid at beam energy of 2 kV

 

 

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